Coper Electronics - Products information
|Measuring instrument of static characteristics for Wafer Chip|
► This is a static characteristic examination device in the chip unit.
|Object devices||N-Ch IGBT / MOS-FET Diode|
|The main measurement items||
- The setting of the measurement condition is interactive to HOST PC.
- Measurement data is recorded by Comma Separated Value.
- Room temperature/high temperature measurement
★ This specification is one example. Please inquire details.