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Dynamic characteristics Measureing Instruments / Tester for Power Module (Addition of chamber for heating/cooling) |
► VCE(SUS) , load short-circuit test and the switching time measurement are achieved with one equipment.
► Best for the dynamic characteristic measurement under the low/high temperature environment.
■ Specifications
| Object devices | N-Ch IGBT / IPM / MOS-FET Diode |
| SW TIME | VCC:1000V IC:1000A VG:+/-20V |
| VCE(SUS) | VCC:1000V IC:2000A VG:+/-20V VCE(SUS): 2500V |
| Load short-circuit | VCC:1000V IC:5000A VG:+/-20V |
| Inductance | L: 3uH - 1mH |
| Wave Acquisition | D.S.O. |
| Range of temperature setting | -40°C - +150°C |
★ This specification is one example. Please inquire details.
|
| Dynamic characteristics Measureing Instruments / Tester for Power Module |
► VCE(SUS) , load short-circuit test and the switching time measurement are achieved with one equipment.
► With built-in low inductance switch
■ Specifications
| SW TIME | VCC:1000V Ic:1000A VG:+/-20V |
| VCE(SUS) | VCC:1000V Ic:2000A VG:+/-20V VCE(SUS): 2500V |
| Load short-circuit | VCC:1000V IC:5000A VG:+/-20V |
| Inductance | L: 3uH - 1mH |
| Wave Acquisition | D.S.O. |
| Test Fixture | Various |
★ This specification is one example. Please inquire details.
Coper Electronics - Products information