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| Dynamic characteristics Measureing Instruments / Tester for wafer-chip |
► The dynamic response test in the chip unit became possible by a highly accurate
positioning and the probing technology.
■ Specifications
| Object devices | N-Ch IGBT / MOS-FET Diode |
| SW TIME | VCC:1000V IC:1000A VG:+/-20V |
| VCE(SUS) | VCC:1000V IC:2000A VG:+/-20V VCE(SUS): 2500V |
| Load short-circuit | VCC:1000V IC:5000A VG:+/-20V |
| Inductance | L: 3uH - 1mH |
| Wave Acquisition | D.S.O. |
| Others | Palette supply and classification storage function |
★ This specification is one example. Please inquire details.
Coper Electronics - Products information