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Semiconductor Measureing Instruments of the Coper ElectronicsCoper Electronics - Products information
         (Semiconductor Measureing Instruments)

Dynamic characteristics Measureing Instruments for Power Module
(Addition of chamber for heating/cooling)

Dynamic characteristics Measureing Instruments for Power Module (Addition of chamber for heating/cooling)
Dynamic characteristics Measureing Instruments for Power Module
(Addition of chamber for heating/cooling)


► VCE(SUS) , load short-circuit test and the switching time measurement are achieved with one equipment.
► Best for the dynamic characteristic measurement under the low/high temperature environment.


■ Specifications

Object devicesN-Ch IGBT / IPM / MOS-FET Diode
SW TIME VCC:1000V IC:1000A VG:+/-20V
VCE(SUS) VCC:1000V IC:2000A VG:+/-20V
VCE(SUS): 2500V
Load short-circuit VCC:1000V IC:5000A VG:+/-20V
Inductance L: 3uH - 1mH
Wave Acquisition D.S.O.
Range of temperature setting -40°C - +150°C

★ This specification is one example. Please inquire details.

 

Dynamic characteristics Measureing Instruments for Power Module

Dynamic characteristics Measureing Instruments for Power Module
Dynamic characteristics Measureing Instruments for Power Module


► VCE(SUS) , load short-circuit test and the switching time measurement are achieved with one equipment.
► With built-in low inductance switch


■ Specifications

SW TIME VCC:1000V Ic:1000A VG:+/-20V
VCE(SUS) VCC:1000V Ic:2000A VG:+/-20V
VCE(SUS): 2500V
Load short-circuit VCC:1000V IC:5000A VG:+/-20V
Inductance L: 3uH - 1mH
Wave Acquisition D.S.O.
Test Fixture Various

★ This specification is one example. Please inquire details.

 


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